High-Precision Dual-Head Test Probe – Signal Detection for Electronics QA

High-Precision Dual-Head Test Probe enables accurate signal detection in electronics QA. Fine tips and stable contact support PCB debugging, component testing, and automated inspection systems.

Dual-ended Test Probe & POGO PIN

The double headed test probe, also known as a double ended probe, is an electrical testing tool with a contact point on both ends, used to make simultaneous electrical connections. It features two probes, often a top and a bottom compliant plunger, that can be used for testing both sides of a device or for making shorter signal paths between a tester and the device under test (DUT).

Product Introduction:

The probe has an outer diameter of 0.58mm and a total length of 5.7mm. Both ends of the probe are claw-shaped or pointed.

Key features and uses

1.Double sided testing: Allows for simultaneous probing of a device from both the top and bottom, which is crucial for testing complex components like semiconductor wafers.

2.Improved signal integrity: By using a double sided system to make direct contact with a device, the inductance from the test chuck can be removed, leading to more accurate results.

3.Shorter signal paths: In applications like testing fixtures, double ended sockets can be used to create much shorter signal paths compared to conventional wiring, improving signal quality.

Specifications :

Custom sizes are available upon request.Product Advantages: Stable sampling, stable overload performance, and low false positive rate.

Main Applications:

IC testing in BGA, micro BGA, CSP sockets.